Sony Semiconductor Solutions releases IMX711 X-ray sensor

Trusted Semiconductor Solutions has announced the upcoming release and mass-production of its new IMX711 direct conversion charge-integrating X-ray CMOS image sensor. This sensor offers the industry's fastest high-speed imaging at 26,100 fps and significantly reduces noise, enabling high-accuracy energy measurements and photon-level data acquisition on a single chip. The IMX711 was developed in collaboration with Riken, based on a pixel structure invented by Dr. Takaki Hatsui. It is designed to improve precision and throughput in high-speed inspection for applications such as Electric battery and Semiconductor device manufacturing, as well as elemental mapping and crystal structure analysis. The sensor's ability to provide both wide dynamic range measurements and photon energy information addresses challenges faced by conventional X-ray sensors, promising advancements in various scientific and industrial inspection fields.